We are delighted to invite you to participate in 2009 International Conference on Test and Measurement in Hong Kong.The objective of ICTM 2009 is to provide a forum for researchers, educators, engineers, and government officials involved in the general areas of Test and Measurement to disseminate their latest research results and exchange views on the future research directions of these fields.
The main topics are:
Test theories and its application
Acoustic and ultrasonic measurement
ADC,DAC and data acquisition
Artificial intelligence ,nerve net work
Electronic -magnetic measurement
Environment measurement
Flow distribution and visualization
Image and information processing
Laser and optics fiber
Light and radiation detection
Mechanical measurement
MEMS and NEMS
Microwave measurement
Noise and vibration measurement
Nondestructive testing
On-line test
Remote sensing and telemeter
Robotics
Sensors and transducers
Industrial autoimmunization
Control theories and technologies
Automatic adjustment and measurement
