Introduction to Industrial Statistics 2017

Topics

• Basic statistics: measurements of central tendency and variation
• How variation and accuracy affect quality; your process as a musket or a rifle
• Statistical hypothesis testing; null and alternate hypothesis, and associated risks
• Compound events (and/or relationships) and application to series and parallel reliability and rolled throughput yield (RTY)
• The normal or bell curve distribution
• Discrete (attribute) data distributions: hypergeometric, binomial, and Poisson distributions
• X chart for individual measurements
• Control charts (SPC)
• Measurement System Analysis (MSA), or gage reproducibility and repeatability

Who should Attend

Attendees from:

• Managers, and Technicians
• Manufacturing Engineers