Description
This Topical Conference provides a forum for discussion on the quantitative aspects of surface analysis and on surface, interface and thin-film characterization. The program will consist of invited presentations and a poster session of contributed papers. Each invited paper will be followed by an extended discussion period. This small topical meeting has proven to be useful to students and others new to quantitative surface analysis and for more experienced researchers to see the current state of the art in a variety of methods. Special arrangements are made to encourage student participation, in the form of a greatly reduced registration fee.
