SPIE Optical Metrology 2013

SPIE Optical Metrology 2013 is a conference focused on the role of Laser technology and cover the following topics:

• Modeling Aspects in Optical Metrology
• Optical Measurement Systems for Industrial Inspection
• Range Imaging, Videometrics and Applications
• Optics for Architecture, Arts and Archaeology
• Automated Visual Inspection
• Optical Methods for Characterization, Inspection and Imaging of Biomaterials

Who should Attend

• Engineers
• Scientists
• Product developers
• Researchers