Topics
- Basic Statistics - Dispersion
- Basic Statistics - Central tendency
- Basic Statistics - Graphical displays and Normal distribution
- Basic Statistics - Proportions and Percentages
- SPC - Control limits vs. Spec limits
- SPC - Introduction and Data patterns
- SPC - Process capability
- SPC - Types of charts (variable and attribute)
Who should Attend
Quality Engineers, Quality Managers, CAPA investigators, Small business owners, Technicians and Metrology/Calibration Techs, Inspectors, Product development engineers, Consultants, Internal and External Quality Auditors.
