XTOP 2014 - The 12th Biennial Conference on High-Resolution X-Ray Diffraction and Imaging is dedicated to phase contrast imaging, synchrotron-based high-resolution X-ray diffraction methods and micro-tomography. Topics include:
- Applications
- Nanomaterials/Nanoscience
- Material science (single crystals, heterostructures, surface and interfaces)
- Non destructive testing (including industrial needs and cultural heritage)
- Biomedical
- Methods & Techniques
- Phase contrast imaging
- X-ray topography
- High resolution XRD
- Standing wave technique
- Grazing Incidence diffraction
- Microdiffraction
- Time resolved diffraction
- X-ray reflectometry, SAXS/GISAXS
- Resonant (anomalous) scattering
- Coherent imaging (incl. SAXS, Bragg CDI, X-ray Holography)
- Theory of X-ray diffraction in crystals
- Fast tomography
- Instruments
- New developments for laboratory diffractometry and imaging
- X-ray optics and instrumentation
- X-ray Free-Electron Lasers
Who should Attend
Scientists from the fields of:
- Reflectometry
- X-ray diffractometry
- Coherent and conventional X-ray diffraction imaging
- Standing waves
- X-ray phase contrast imaging (radiography and micro- tomography)
- Topography
